Jeolの全製品
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Specimen Preparation Equipment (CP)
MultiBeam System (FIB)
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
X-ray Fluorescence Spectrometer (XRF)
Nuclear Magnetic Resonance Spectrometer (NMR)
Software
Electron Spin Resonance Spectrometer (ESR)
ESR Peripheral Equipment
GC-MS
MALDI-TOFMS
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