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... from your TEM samples. Overview Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM ...
Hitachi High-Tech Europe GmbH
... device. Micro-samples are cut out or trimmed in various shape by varying the incident FIB-direction System configuration example FIB-STEM System A new-developed semiconductor ...
Hitachi High-Tech Europe GmbH
The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit ...
Hitachi High-Tech Europe GmbH
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
Hitachi High-Tech Europe GmbH
... results and therefore very effective for rapid cross section preparation of specimens with a target structure far from the top surface. Hybrid Milling Cross section Milling A pristine surface ...
Hitachi High-Tech Europe GmbH
The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Features Cross-section ...
Hitachi High-Tech Europe GmbH
Automated EM Stainer After ultramicrotomy, most sections require contrasting with lead and uranyl salts. As well as being hazardous if not handled correctly, both can cause precipitates during the contrasting process. To provide ...
Boeckeler Instruments, Inc.
... of a protocol. Frugal! Can use just a couple of milliliters of fluid for one sample up to 18ml for a full load (up to 48 sample compartments). Two proven sample handling systems, ...
Boeckeler Instruments, Inc.
The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6.4 mm, 8 mm and 10 mm. Since the introduction of the world’s first glass knife maker in 1962, Leica Microsystems has continuously refined ...
... performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems. Flexible system ...
CROSS SECTION POLISHER™ (CP) is a device to prepare a cross section of a specimen for electron microscopy. Since a cross section is prepared with an ion beam, it is possible to obtain a good quality ...
Jeol
... multi-purpose stage combined with specialized functional holders allows the user to perform various functions such as planar surface milling and polishing, sputter coating as well as more traditional cross-section ion ...
Jeol
... irradiated at a low angle relative to the sample, allowing contamination on the surface layer to be removed, as well as smoothing of the surface. It is also ideal for selective etching. Cross Section ...
Jeol
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
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