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The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation. Sample analysis takes only a few seconds and provides a complete report that fully describes ...
HORIBA Scientific
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and ...
HORIBA Scientific
... than 1 sec PHE101 ellipsometer is an ideal discrete wavelength ellipsometer designed for measuring the refractive index, extinction coefficient(n & k) and thickness of single and multi-layer films. ...
Angstrom Advanced Inc.
... prices.Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Our ellipsometers ...
Angstrom Advanced Inc.
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