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Resolution: 1.6, 2.1, 4 nm
... The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. ...
Resolution: 2.8, 60, 4, 3.5 nm
... NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface ...
Resolution: 4, 60, 0.7, 50, 1.5 nm
... The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing. Key ...
... ion beam-scanning electron microscope ( FIB-SEM) for extra-large volume analysis and high throughput cryo applications. Equipped with the iFIB+ column, TESCAN AMBER X supports cryo- FIB applications previously ...
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