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Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
... can be mounted close to the sample for high-resolution elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated ...
Hitachi High-Tech Europe GmbH
Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm
FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, ...
Hitachi High-Tech Europe GmbH
... Area Electron Diffraction) modes as well as in scanning modes (STEM– Scanning Transmission Electron Microscope and SEM – Scanning Electron Microscope avec BSE – Backscattered ...
... Observation and Analysis Function "Neo Action" SEM observation and EDS analysis can be automated by simply setting the analysis conditions and selecting the areas to measure. SEM Automatic Adjustment ...
Jeol
Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm
... high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality ...
Hitachi High-Technologies
Magnification: 1,000,000 unit
... interface, TESCAN Essence™, which is at the heart of all TESCAN SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes ...
TESCAN GmbH
... electron microscope you are able to view on the submicron and nano scale. Our personal scanning electron microscope (SEM) helps you see beyond the limits of optical. With ...
Magnification: 150 unit
Resolution: 5 nm
This electron microscope is the frist premium table top SEM to combine a 5 axis fully motorized stage and a large chamber which allows to fit large samples. The high votage is adjustable from 1 to 30 ...
Magnification: 25 unit - 200,000 unit
Weight: 330 kg
Length: 835 mm
... fully functional atomic force microscope with SEM. It is capable of most normal measurement modes expected from a standard AFM, including contact, dynamic, and FIRE modes. Switch between a sub-nanometer ...
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