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Magnification: 3,000,000 unit
Resolution: 0.8, 0.7, 1.2, 0.4 nm
... high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm
... brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.7 nm
... SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
Magnification: 1 unit - 2,000,000 unit
ZEISS GeminiSEM stands for effortless imaging with sub-nanometer resolution. These FE-SEMs (field emission scanning electron microscope) combine excellence in imaging and analytics. Innovations in electron ...
ZEISS Microscopy
The smallest TEM in the world… The LVEM5 is a compact benchtop instrument that combines high resolution imaging with the small footprint of an optical microscope. It consists of four separate parts; ...
Magnification: 1,000,000 unit
... interface, TESCAN Essence™, which is at the heart of all TESCAN SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes ...
TESCAN GmbH
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window ...
TESCAN GmbH
TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window ...
TESCAN GmbH
Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm
... high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality ...
Hitachi High-Technologies
Resolution: 0.5 nm - 3 nm
... system of seamless GUI "SEM Center" for fast elemental mapping with a fully embedded JEOL energy dispersive X-ray spectrometer (EDS), as a common platform. The JSM-IT800 allows for the replacement of the objective ...
Jeol
... electron microscope you are able to view on the submicron and nano scale. Our personal scanning electron microscope (SEM) helps you see beyond the limits of optical. With 20 times ...
Magnification: 150 unit
Resolution: 5 nm
This electron microscope is the frist premium table top SEM to combine a 5 axis fully motorized stage and a large chamber which allows to fit large samples. The high votage is adjustable from 1 to 30 ...
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