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Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.7 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.1, 0.08 nm
Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt ...
Magnification: 600,000, 800,000, 1,000,000 unit
Resolution: 0.14, 0.19, 0.2 nm
... cutting-edge solution for modern TEM analyses. Features Hitachi's Dual-Mode objective lens supports easy observation under low magnification, wide-field high contrast, high resolution, and more—all in one microscope. Normal ...
The smallest TEM in the world… The LVEM5 is a compact benchtop instrument that combines high resolution imaging with the small footprint of an optical microscope. It consists of four separate parts; ...
Resolution: 0.05 nm - 0.17 nm
... elemental maps. The TEM column is covered by a box-type enclosure, which can reduce the effect of environmental changes such as temperature, air flow, acoustic noise and so on, and then it improves the stability of ...
Jeol
Resolution: 0.1, 0.07, 0.16, 0.11, 0.25 nm
... atomic-resolution imaging. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM ...
Jeol
Resolution: 0.23, 0.19, 0.16, 0.14 nm
... accumulated over the years. Quad-Lens condenser system Today's electron microscopy requires to support a wide range of imaging techniques from bright field/dark field TEM to STEM ...
Jeol
... (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale Fast setup of the electron beam – optimal imaging conditions ...
TESCAN GmbH
... Electron Beam Precession and near-UHV A novel approach to STEM User Experience Analytical 4D-STEM The full picture of electron beam - specimen interaction 4D-STEM is the microscopy ...
TESCAN GmbH
Robust design with all metal frames for the college and STEM marketplace; Featuring dual carrying handles available in 8 different colors for Laboratory Identification, LED illumination is standard across all models
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