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Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners in the field of TEM. Product features: - ...
Hitachi High-Tech Europe GmbH
Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm
The HT7800 family supports a wide range of applications, from life sciences to materials science. It’s available in three different pole piece variants, always based on our patented objective lens for fast switching between high contrast ...
Hitachi High-Tech Europe GmbH
Magnification: 0 unit
Resolution: 4, 60 nm
... platform targets advanced position-accurate applications in the areas of automated production of ultra-fine TEM lamellae for aberration-corrected TEM/STEM, high-resolution multi signal SEM examination ...
Hitachi High-Tech Europe GmbH
Resolution: 1.6, 2.1, 4 nm
In this unique system, the Ga-FIB and FE-SEM columns are at right angles to each other. This configuration is ideal for applications where large volumes (biological tissue, materials with large grain structures, semiconductor components, ...
Hitachi High-Tech Europe GmbH
Resolution: 2.8, 60, 4, 3.5 nm
NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface ...
Hitachi High-Tech Europe GmbH
... smallest commercial transmission electron microscope in the world, and features all the standard imaging modes that can be found in conventional TEMs and more. The LVEM5 can work in transmission ...
Magnification: 50 unit - 1,200,000 unit
Resolution: 0.2, 0.14 nm
Width: 840 mm
Transmission Electron Microscopes(TEM) with 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We newly developed JEM-120i with the concept ...
Jeol
... energy filter, a side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. The automated ...
Jeol
Resolution: 0.05 nm - 0.17 nm
... elemental maps. The TEM column is covered by a box-type enclosure, which can reduce the effect of environmental changes such as temperature, air flow, acoustic noise and so on, and then it improves the stability of ...
Jeol
Resolution: 0.1, 0.07, 0.16, 0.11, 0.25 nm
... technique (e-ABF: enhanced ABF), facilitating observation of light-element materials, even at low accelerating voltages. The microscope room is separated from the operation room to respond to a remote operation. In ...
Jeol
Resolution: 0.23, 0.19, 0.16, 0.14 nm
... JEM-F200 is a field emission transmission electron microscope, which features higher spatial resolution and analytical performance coupled with intuitive user interface for multi-purpose operation. Features High-resolution ...
Jeol
Resolution: 0.14 nm - 0.19 nm
The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior ...
Jeol
Magnification: 2,000 unit - 1,500,000 unit
Resolution: 0.1 nm - 0.31 nm
The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons ...
Jeol
Magnification: 10 unit - 1,500,000 unit
Resolution: 0.2, 0.14 nm
... increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image ...
Jeol
Resolution: 4, 60, 0.7, 50, 1.5 nm
... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, ...
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