AFM microscope AA2000

digitalSTMlaboratory

Atomic-scale of resolution Large sample size DSP(Digital Signal Processing) for great performance Real time operating system embedded Fast Ethernet connection with computer Multi-Function Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) Force Analysis: I-V Curve, I-Z Curve, Force Curve Online real-time 3D image for better observation Multi-channel signals for more sample details Trace-Retrace scan, Back-Forward scan Multi-Analysis: Granularity and Roughness Data load-out for further analysis Easy Operation Fast automatically tip-engaging Easy change of the tip holder, for simple switching between STM and AFM Full digital control, auto system status recognition Software-based sample movement Nano-Movie function: Continuous data collection, storage and replay Specifications Technical Parameters X-Y scan scope: ~ 10 micrometer Z distance: ~ 2 micrometer Image Pixels: 128 × 128, 256 × 256, 512 × 512, 1024 × 1024 Scan Angle: 0 ~ 360° Scan Rate: 0.1 ~ 100 Hz Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet Mechanics Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000, and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm Modularized design for convenient maintenance and future upgrades Software Online Control Software and offline Image Processing Software