OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform for unconventional experiments but also for further developments.
Features
Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
Imaging with Full digital control 16bit ADC/DAC
High speed communication based on TCP/IP protocol for double-CPU-double-OS and
large data-exchange
Input/output signal channel preserved for further system extension
Standard external open interface for second developments
I-V Curve and Force-Curve
Nano-Processing
Nano-manipulating with Super-Multimedia technology
Designed for Windows Vista/XP/NT/2000/9X
Hardcode and Dynamic Code both applied to offline software
Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness
Specifications
Current Sensitivity: ≤10pA
Force Sensitivity: ≤ 1nN
Positioning Accuracy: ≤ 0.5nm
Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
DI/DO channels preserved: 8ch DI, 8ch DO