Scanning probe microscope AA5000
digitallaboratorymulti-function

Scanning probe microscope - AA5000  - Angstrom Advanced Inc. - digital / laboratory / multi-function
Scanning probe microscope - AA5000  - Angstrom Advanced Inc. - digital / laboratory / multi-function
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Characteristics

Type
digital, scanning probe
Applications
laboratory, multi-function
Observation technique
3D
Configuration
benchtop
Resolution

0.01 nm, 0.13 nm

Description

AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system. Features Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change of the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a 10M/100M Fast Ethernet; Large sample size: up to diameter 45mm, 30mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction;

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