Atomic force microscope attoAFM I

laboratorycompact

alignment-free cantilever holder → tip exchange in less than 2 minutes interferometric cantilever deflection detection → built-in amplitude gauge closed loop scanning (optional) → easy retrieval of regions-of-interest The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperature, and in high magnetic fields. The instrument works by scanning the sample below a fixed cantilever and by measuring its deflection with highest precision using a fiber based optical interferometer. This deflection detection technique has the advantage that it comes with a built-in length gauge for the cantilever oscillation amplitude, since the interferometer contrast is directly proportional to the laser wavelength. Both contact and noncontact mode are applicable. It is mainly employed for magnetic force microscopy (MFM) such as vortex imaging on superconductors or magnetic domain imaging at variable temperature, and for piezo-response force microscopy (PFM) on ferroelectrics and multiferroics. Other supported AFM measurement modes include Kelvin Probe Force Microscopy (KPFM), conductive AFM (c-AFM), electric force microscopy (EFM), and other imaging modes. For more information, please have a look at our microscopy fundamentals. The rigid design of the microscope module allows also for combinations with cryogen free pulse-tube based cooling systems for applications where liquid helium is not available or desired.