Optical profilometer ContourX-500

inspectionmultipurpose3D

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing models in a much smaller footprint. The profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices. Tip/tilt optical head Measures surface features over a range of angles while minimizing tracking errors. Most advanced user interface Provides intuitive access to an extensive library of pre-programmed filters and analyses. Integrated air isolation Provides best metrology precision in a space-efficient footprint. Designed for Unmatched Benchtop Metrology Bruker’s proprietary tip/tilt in the head provides unmatched user flexibility for production setup and inspection. By coupling the auto tip/tilt functionality with the optical path in the microscope head, Bruker has coupled the point of inspection to the line of sight independent of tilt. This results in less operator intervention provides the maximum reproducibility. Other hardware features include an innovative stage design for larger stitching capabilities and a 5MP camera with a 1200x1000 measurement array for lower noise, larger field-of-view, and higher lateral resolution. The combination of these features with automated staging and objectives makes the ContourX-500 ideally suited to “measure-on-demand” R&D