AFM spectrometer IconIR

infraredFT-IRfor nanotechnology

Bruker’s large-sample Dimension IconIR™ system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-best AFM measurement capabilities of the Dimension Icon®. The system enables correlative microscopy and chemical imaging with enhanced resolution and monolayer sensitivity, while its unique large-sample architecture provides ultimate sample flexibility for the broadest range of applications. Productive guided workflow and programmable stage Provides highest measurement throughput with intrinsically easy-to-use AFM-IR. Multimodal chemical and property mapping Delivers quantitative nanochemical, nanomechanical, and nanoelectrical data. Sub-5nm patented photothermal AFM-IR imaging Enables highest resolution, best signal-to-noise characterization with monolayer sensitivity. First-and-Only nanoIR Capabilities and Performance In a single system, IconIR provides the highest performance for nanoscale infrared spectroscopy, chemical imaging resolution, and monolayer sensitivity. Only Dimension IconIR delivers: High-performance nanoIR spectroscopy with accurate and repeatable FTIR correlation, <5 nm chemical resolution, and monolayer sensitivity Correlative chemical imaging with PeakForce Tapping® nanomechanical and nanoelectrical modes Highest Performance AFM imaging and unmatched sample flexibility with large-sample accommodation*