Atomic force microscope FastScan®

biologicalfor materials researchupright

The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience. No-compromise high-speed performance Delivers highest resolution any time, every time, independent of sample size. Real-time nanoscale dynamics Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid. Automated setup, data acquisition, and analysis Makes system operation surprisingly simple while enhancing productivity, allowing you to focus on your research. FEATURES Benchmark for High Speed and High Resolution Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals. Exceptional Productivity Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation.