Atomic force microscope Innova®

opticaldigitalfor research

The compact Innova® atomic force microscope (AFM) delivers application flexibility for the most demanding scientific research at a moderate cost. Its unique closed-loop scan linearization system ensures accurate measurements and noise levels approaching those of open-loop operation. The integrated, high-resolution color optics, open stage, and software experiment selector make setting up each new experiment fast and easy. With its highly customizable feature set, Innova offers the utmost value for high-resolution imaging and a wide range of functionality in physical, life, and material sciences research. Routine high-resolution imaging Ensures accurate measurements at all scales and in all dimensions. Fast setup and workflow Delivers fast and precise characterization for experiments, from survey to atomic resolution. Powerful research flexibility Customizes experiments with full range of SPM modes and configurable signal access. FEATURES Streamlined Design All aspects of the Innova electromechanical design have been optimized, from the rigid microscope stage with a short mechanical loop and low thermal drift to the ultralow-noise electronics. The result is a unique combination of high-resolution performance and closed-loop positioning. Innova uses Bruker’s proprietary ultralow-noise digital closed-loop scan linearization for accurate measurements in all dimensions, regardless of size, offset, speed, or rotation in air and liquid. Patented Top-Down Optics With software-controlled optical zoom, Innova optics provide a broad range of magnification,