AFM microscope Icon®

for researchfloor-standinghigh-resolution

Bruker’s Dimension Icon® brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. Highest Performance tip scanner Delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates. Easy productivity Provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time. Versatile open-access platform Accommodates the widest variety of experiments, modes, techniques and semi-automated measurements. FEATURES Highest Performance and Resolution The superior resolution of the Dimension Icon, in conjunction with Bruker’s proprietary electronic scanning algorithms, provide the user with a significant improvement in measurement speed and quality. The Icon is a culmination of Bruker's industry-leading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in XY. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the open-loop noise levels of high-resolution AFMs.