Atomic force microscope Edge™

for researchbenchtop

Dimension Edge™ incorporates Bruker's PeakForce Tapping® technology to provide the highest levels of atomic force microscope (AFM) performance, functionality, and accessibility in its class. Based on the Dimension Icon platform, the Edge system has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance. Integrated visual feedback and preconfigured settings enable expert-level results simply and consistently, making the most advanced large-sample AFM capabilities and techniques available to every facility and user. Modular microscope and electronics Offers high image fidelity and flexibility of research at moderate cost. Built-in access to signal routing Enables custom measurements and extended research capibilities. Integrated stage control Provides fast sample navigation and efficient multi-site measurements. Closed-Loop Accuracy At the heart of this system’s capabilities is Bruker’s renowned closed-loop scanner. Incorporating temperature-compensating position sensors and driven by modular, low-noise control electronics, this tip-scanning component reduces closed-loop positioning noise levels to the length scale of a single chemical bond. Large Sample Stage The Dimension Edge sample stage is not only motorized and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time.