Raman microscope Icon
AFMfor materials researchbenchtop

Raman microscope - Icon - Bruker Nano Surfaces - AFM / for materials research / benchtop
Raman microscope - Icon - Bruker Nano Surfaces - AFM / for materials research / benchtop
Raman microscope - Icon - Bruker Nano Surfaces - AFM / for materials research / benchtop - image - 2
Raman microscope - Icon - Bruker Nano Surfaces - AFM / for materials research / benchtop - image - 3
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Characteristics

Type
Raman, AFM
Applications
for materials research
Configuration
benchtop
Other characteristics
high-resolution

Description

The Icon AFM-Raman system brings together the complimentary techniques of atomic force microscopy and Raman microscopy to provide critical information on both the topography and the chemical composition of a sample. When these techniques are further enhanced with advanced AFM modes, such as Bruker-exclusive PeakForce TUNA™ electrical characterization and PeakForce QNM® quantitative nanomechanical mapping, researchers are able to better understand the mechanisms that lead to specific material properties. Correlated AFM and u-Raman data Enables co-localized measurements with unsurpassed efficiency and ease. Advanced AFM modes Help researchers better understand the mechanisms that lead to specific material properties. Proven Sets a new performance standard for micro-Raman research capabilities. Configuration Stability and Flexibility The AFM-Raman system, consisting of the Dimension Icon® AFM and a research-grade confocal Raman microscope (Horiba, LabRam), is on a single, rigid, anti-vibration platform. This configuration allows the system to maintain each individual instrument's full functionality, providing optimum combined performance. As an example, the confi guration enables the full complement of Icon upgrades, AFM modes, and ease-of-use features, including Bruker-exclusive ScanAsyst®. You are able to tailor the most effective combination of modes for your application. Seamless Technique and Analysis Integration Within seconds a sample can be transferred between the two techniques without disturbance. AFM and spectroscopic measurements of the same sample area are carried out consecutively without danger of misalignment or imprecise location of features.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.