Scanning probe microscope XR

for nanocharacterizationuprightbenchtop

Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier. Hyperspectral nanoelectrical characterization Includes the most complete array of electrical AFM techniques for characterization of functional materials, semiconductors, and energy research. Sub-100nm electrochemical imaging Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion. Out-of-the-box nanomechanical analysis Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials. XR Nanomechanics provides a range of modes to comprehensively detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains. Researchers correlate nanomechanics data to bulk DMA and nanoidentation methods with our proprietary AFM-nDMA™ mode. Achieve quantifiable nanoscale characterization extending from soft sticky hydrogels and composites to stiff metals and ceramics.