InGaAs camera C15333-10E

inspectionscreeningdigital

SWIR (short-wavelength infrared) imaging is a great solution for nondestructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality. Integrating SWIR imaging into production lines requires cameras such as the C15333-10E InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line nondestructive inspection. Features SWIR sensitivity from 950 nm to 1700 nm 1024 pixel linear array Maximum line rate: 40 kHz Interface: Employs Gigabit Ethernet Equipped with high quality images (Background subtraction, Real time shading correction) Applications Food and agricultural products (damage inspection, quality screening, material discrimination, etc.) Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.) Industry (moisture content, leak detection, container inspection, etc.) Specifications Imaging device - InGaAs line sensor Effective no. of pixels - 1024 (H) × 1 (V) Cell size - 12.5 μm (H) × 12.5 μm (V) Effective area - 12.8 mm (H) × 0.0125 mm (V) Readout speed - Internal mode: 40 kHz (21 μs exposure time) Sync readout: 40 kHz Exposure time - 21 μs to 1 s (1 μs step) External trigger input - Sync readout External trigger signal routing - 12 pin SMA or HIROSE connector Image processing functions - Background subtraction, Real time shading correction Interface - Gigabit Ethernet A/D converter - 14 bit Lens mount - C mount Power supply - DC 12 V Power consumption - 6 W max. Ambient operating temperature - 0 ℃ to +40 ℃ Ambient storage temperature - -10 ℃ to +50 ℃