The C12741-03 is an InGaAs camera with sensitivity in the near infrared region from 950 nm to 1700 nm.
It has an analog output (EIA) and a USB 3.0 interface port which supports 14 bit image acquisition and exposure time adjustment. This makes the C12741-03 ideal for use in a wide range of applications including internal inspection of silicon wafers and devices, laser beam alignment and evaluation of solar cells.
Features
High sensitivity in the near infrared region
Resolution: 640 × 512 pixels
Low noise and high stability with cooling
Simultaneous output from two interfaces: analog (EIA) port and USB 3.0 port
Frame rate of 60 frames/s
Applications
Internal inspections of silicon wafers and devices
Evaluation of solar cells
Evaluation and analysis of optical communication devices
EL/PL image acquisition
Specifications
Imaging device - InGaAs sensor
Effective no. of pixels - 640 (H)×512 (V)
Cell size - 20 μm × 20 μm
Effective area - 12.8 mm (H) × 10.24 mm (V)
Readout speed - 59.774 frames/s
Exposure time - 16.7 ms to 1 s
Cooling method - Peltier cooling
Cooling temperature - +10 °C (Forced-air cooled, Ambient temperature +25 °C)
External trigger mode - Edge trigger, level trigger, start trigger
External trigger signal routing - SMA
Trigger delay function - 0 to 1 s (in 10 μs steps)
Image processing functions - Background subtraction, Shading correction
Interface - EIA, USB 3.0 *
Connector - USB 3.0 micro B type
A/D converter - 14 bit
Lens mount - C-mount
Power supply - DC +12 V
Power consumption - Approx. 16 W
Ambient operating temperature - 0 ℃ to +40 ℃
Ambient storage temperature - -10 ℃ to +50 ℃