SEM electron microscope NPS
laboratory3Dconfocal

SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal - image - 2
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal - image - 3
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal - image - 4
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal - image - 5
SEM electron microscope - NPS - Hirox Europe - laboratory / 3D / confocal - image - 6
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Characteristics

Type
SEM
Applications
laboratory
Observation technique
3D, confocal
Configuration
benchtop
Light source
LED, white light
Options and accessories
motorized
Resolution

1 µm, 1.8 µm, 2.5 µm, 2.6 µm, 4.6 µm

Description

The NPS is a white light confocal point sensor combined with an high precision motorized stage. It enables submicron altitude measurement on any type of surface without any contact on the sample. High Speed Profile By moving the sample with the high precision motorized XY stage in one axis, the NPS acquires a series of focused points at a chosen interval, creating a fast profile: the measurement of height, distance, radius, line roughness (Ra, Rz, Rt,…) and much more can be done within seconds! High Resolution Surface By creating a series of aligned profiles, the NPS acquires XYZ information creating a high resolution 3D surface: volume, surface roughness (Sa, Sz,…), complex shape, 3D waviness and much more can be measured – the duration of the scan is adjusted by the amount of lines, scanning speed and the dimension of the sample! White Light Confocal Measurement The NPS is an innovative non-contact confocal 3D profilometer measuring altitude in real time, for profile or surface scanning: The white light LED beam is projected through a beamsplitter and a chromatic lens to the surface of the sample The reflected light beam from the sample is filtered in a confocal pinhole, isolating one single wavelength in perfect focus The NPS spectrometer is accurately translating this wavelength into height information and display it visually in the NPS software Up to 2000 height information per second are acquired in real time creating a profile when moving the XY stage You can select between two modes: Profile or Surface

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