Scanning electron microscope FlexSEM 1000 II
opticalbiologicalmultipurpose

Scanning electron microscope - FlexSEM 1000 II - Hitachi High-Tech Europe GmbH - optical / biological / multipurpose
Scanning electron microscope - FlexSEM 1000 II - Hitachi High-Tech Europe GmbH - optical / biological / multipurpose
Add to favorites
Compare this product
 

Characteristics

Type
optical, scanning electron
Applications
laboratory, for materials research, biological, multipurpose
Configuration
benchtop, compact, floor-standing
Electron source
thermionic
Other characteristics
high-resolution
Magnification

10,000 unit, 15,000 unit, 30,000 unit, 50,000 unit, 60,000 unit

Resolution

4 nm, 5 nm

Description

The FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivaled imaging performance, even in variable-pressure environments, a feature previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance. Overview The FlexSEM 1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this microscope will certainly expand your analyses as well as your expectations. Compact & High-Performance Column Best-in-class resolution in a compact system. The FlexSEM employs a newly designed electrical optical system with a reliability-proven high-sensitivity detector, achieving imaging at 4 nm. High resolution image The electron optics incorporate a low aberration objective lens and a unique gun bias system that allows delivery of high emission current. Ultra-Variable-Pressure Detector Novel low vacuum technologies enable observation of the surface of non-conductive specimens without preprocessing, across the entire pressure and accelerating voltage ranges.

VIDEO

Catalogs

No catalogs are available for this product.

See all of Hitachi High-Tech Europe GmbH‘s catalogs
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.