SEM microscope TM4000PlusIII

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Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, depth of field, and contrast between different materials. All without time-consuming preparation (uncoated). If needed, you can also determine the chemical composition and element distribution. Easy navigation on the motorised X,Y sample stage is done using an automatically generated, zoomable colour photo overview. This can be supplemented locally by SEM photo snapshots. Product features: - EDX with 30mm2 or 60mm2 sensor size can be fully integrated, immediate switching between observation and element analysis - 4 acceleration voltages 5 | 10 | 15 | 20kV with 5 probe current modes each - Optical colour navigation camera - 3 chamber pressure stages - 4-segment backscattered electron detector - Probe current reading and IFT functionality