STEM microscope HF5000

TEMlaboratoryfor materials research

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration. The HF5000 builds on features from Hitachi HD-2700 dedicated STEM including Hitachi's own fully automated aberration corrector, symmetrical dual SDD EDX and Cs-corrected SE imaging. It also incorporates the advanced TEM/STEM technologies developed in the HF series. Integrating these accumulated technologies into a new 200 kV TEM/STEM platform results in an instrument with an optimum combination of sub-Å imaging and analysis, as well as the flexibility and unique capabilities to address the most advanced studies. Features Hitachi fully automated probe-forming spherical aberration corrector High-brightness and high-stability cold FE electron gun (Cold FEG) Ultra-stable column and power supplies for enhanced instrument performance Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution New high-stability side-entry specimen stage and specimen holders Symmetrically opposed dual 100 mm2 EDX* detectors : "Symmetrical Dual SDD*" Newly designed enclosure for optimum performance in real laboratory environments A wide range of Hitachi advanced specimen holders High-brightness Cold FEG×High-stability×Hitachi automated aberration corrector The new high-stability Cold FEG uses a thoroughly redesigned version of Hitachi's long-established cold field-emission electron source technology.