FE-SEM microscope SU3900SE

multipurposebenchtophigh-resolution

The SU3900SE/SU3800SE Series Microscopes are FE-SEMs that offer high-resolution observation capabilities. They combine easy data acquisition through simple operation with much larger and heavier specimens than existing FE-SEMs. This makes it possible to observe large and heavy specimens including industrial materials such as iron and steel, automotive parts, and aerospace-related parts. Furthermore, the SE Series lineup offers four models (two types with two grades) to meet the measurement needs of a wide variety of fields. Each model provides unique capabilities; for example, the large-chamber models provide the best results for foreign matter and defect analysis, helping drive quality and yield. While the Plus models are ideal for the observation of fine surface structures, creating opportunities for improvements in electronic components and semiconductor manufacturing. Features ●Schottky SEM with large specimen chamber to expand application capabilities Evaluating shapes by electron microscopy is the foundation of all material evaluation and analysis. Demand has always existed for the ability to mount and observe specimens in their original shape. The SU3900SE/SU3800SE Series Microscopes have a highly rigid multipurpose specimen chamber that makes it possible to mount specimens as is. This eliminates the need to perform metal coating of non-conductive specimens and breaking or cutting large and heavy specimens, allowing observation from a wide variety of angles. ●High resolution for improved top-surface imaging The resolution has been improved at both high and low accelerating voltages by adopting a newly developed Schottky electron gun.