AFM microscopy AFM100 Plus

multifunctionalsmall

The AFM100 Series is Hitachi’s next generation probe microscopy platform. The AFM100 Plus and AFM100 systems that make up this series have been designed to expand the capabilities and performance of atomic force microscopy, while providing an easy-to-use platform suitable for users of all experience levels. Experience the finest reliability and innovation with the AFM100 Series. Features Challenges for handling conventional cantilevers • It is difficult to grasp a cantilever with traditional forceps due to its small size. • Cantilevers are very easily damaged with a slight amount of pressure. • Variation in mounting position can cause issues with orientation and operation. Pre-mounted cantilevers streamline the process for higher efficiency and consistency • Simple one-step tip-mounting procedure • Easy to handle without risk of physical damage • Guaranteed consistency of tip orientation • Reliable mechanical and electrical properties Automated measurement & analysis with one-click autopilot function Accomplish measurements and analysis with one click! • Automatic multipoint measurement within a sample • Continuous measurement of multiple samples ► Overall throughput improvement Automatic adjustments with RealTune® Il RealTune* II: A function for automated parameter adjustments ► Automated optimization of imaging conditions • SIS: Sampling Intelligent Scan ► Excellent tip-sample tracking even with high aspect ratio surface features ► Reduced probe wear and longer life Correlative SEM-EDS Analysis with our AFM Marking Function Analyze the same region of interest (ROI) with SEM, EDS, and AFM: More Information = Better Results!