The XploRA™ PLUS is a reliable and high-performance microRaman system designed for scientists, researchers and engineers exploring the microscopic world.
With exceptional sensitivity and resolution, it offers precise chemical and structural analysis. Its SWIFT™ confocal microscopy enables fast and detailed examination of sample composition and structure. With versatile laser excitation options and the possibility of an easy AFM upgrade, it accommodates a wide range of samples and Raman scattering characteristics.
From material science to environmental science, it provides invaluable insights into diverse materials and samples, facilitating detailed analysis. XploRA™ PLUS represents the pinnacle of performance, versatility, and user-friendliness, meeting the demands of modern scientific inquiries with precision and reliability.
SWIFTTM10x faster Raman imaging
Improved detection and sensitivity
Full Confocality for complete image detail
Full optical microscope so you can see your samples
Maximum detail, resolution and range for enhanced spectroscopy
HORIBA’s OneClick easy Raman analysis
NIST traceable and patented Autocalibration options for validated results
Ultimate optical stability- robust, reliable, long term operation
Automated operation offering simple, powerful reliability
2 year base unit warranty as standard
Future-proof Expansion
Compatible with atomic force microscopes for combined Raman-AFM and TERS (Tip Enhanced Raman Spectroscopy)
Multiple laser wavelengths – ensures optimal results and minimised fluorescence interference from the widest range of sample types