SEM microscope JSM-IT510 InTouchScope™

for research3Dbenchtop

Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites. At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process. With the JSM-IT510, the newly added Simple SEM function allows users to "leave the manual repetitive operation to it", required for SEM observation, making SEM observation more efficient and easier. Features Simple SEM Just select the target field Simple SEM supports daily routine work. Specimen Exchange Navi Guide from specimen exchange to automatic observation Safe and simple! Specimen Exchange Navi Magnify the optical image *1, transition to SEM image The Zeromag function simplifies navigation providing a seamless transition from the optical to SEM image. The SEM, optical image and holder graphic are all linked for a global view of analysis locations. Embedded EDS for Real-Time elemental composition during observation Live Analysis is a function which displays the EDS spectrum or element maps in Real-Time during image observation. This function can support searching and provide an alert for target elements. Variety of advanced options Low-vacuum Hybrid Secondary Electron Detector (LHSED)* LHSED is an option. And LV (Low Vacuum) or L A (Low Vacuum & Analysis) is also required. Live 3D * The images obtained by a new quadrant BE detector* can be displayed as a live 3D image. 3D images can clearly represent the shape of a specimen, even for those with subtle topographic information.