FIB electron microscope JIB-PS500i

SEMTEMSTEM

The JIB-PS500i provides three solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen prepartion to TEM observation. Features TEM-LINKAGE The use of JEOL’s double tilt cartridge and TEM holder* facilitates linkage between the TEM and the FIB. The cartridge can be attached to the dedicated TEM specimen holder with a single touch. The adopted OmniProbe 400* (Oxford Instruments) enables precise and smooth pick-up operations and manipulations. The operations of the OmniProbe 400* are integrated into the software for the JIB-PS500i. To precisely and efficiently prepare a TEM specimen, it is essential to quickly check the preparation progress. With its high-tilt stage and detector scheme, the JIB-PS500i allows for seamless transition from FIB milling to scanning transmission electron microscope (STEM) imaging. Fast transitions between lamella processing and STEM imaging lead to efficient specimen preparation. AUTOMATIC PREPARATION The JIB-PS500i automates specimen preparation using the STEMPLING2* automatic TEM specimen preparation system. This automatic system enables any operator to smoothly prepare specimens for TEM. HIGH-RESOLUTION & HIGH-CONTRAST SEM Imaging Stop hesitating, stop missing the end-point in milling. High quality SEM images assist you. Signal detection system Multiple detectors are available, including the standard SED, UED and iBED. Selecting the optimum detector makes it possible to observe sharp images of various specimens under various experimental conditions.