Automatic sample preparation system POLISHER™

laboratoryfor electron microscopycooling

CROSS SECTION POLISHER™ (CP) is a device to prepare a cross section of a specimen for electron microscopy. Since a cross section is prepared with an ion beam, it is possible to obtain a good quality cross section in a shorter time without individual differences, compared to other methods such as polishing, which requires experience. Incorporating the new GUI and Internet of Things (IoT), operation and monitoring of milling process became more user-friendly with the IB-19540CP/IB-19550CCP. High throughput ion source and high throughput cooling system enable rapid and smooth cross section preparation. Features New GUI and Internet of Things (IoT) ～user-friendly and remote control enabled～ Incorporation of a new GUI makes the operation steps easy to understand. Easy setup is possible by following the flowchart on the control panel. Preset functions are available for saving and recalling process conditions tailored to specific applications or specimen types. Connect to LAN for remote access and control through a web browser. Monitor and adjust the milling process over multiple CPs. High throughput ion source High throughput ion source is equipped as standard. The ion current density has been improved by optimizing the ion-source electrode and increasing the accelerating voltage. The standard milling rate is now 1,200 μm/h. High throughput cooling system ～auto cooling and auto return to room temperature～ Cooling to return to normal temperature can be performed automatically. In addition, vacuuming around liquid nitrogen tank is possible from the CP side to maintain cooling retention time and specimen cooling temperature.