The JEM-2200FS, a state-of-the art analytical electron microscope, is equipped with a 200kV field emission gun (FEG) and the in-column energy filter (Omega filter) that allows a zero-loss image, where inelastic electrons is eliminated, resulting in clear images with high contrast. And energy-filtered images forming with electrons at low loss or core loss energy provide chemical state or elemental information of a sample. Also, spectroscopy for elemental analysis and chemical analysis of specimens is available.
In-column energy filter (Omega filter)
The in-column energy filter enables you to obtain energy-filtered images and electron energy loss spectra. The optimally designed filter provides distortion-free filtered images.
Control system
The main components of the JEM-2200FS, such as the optical system, goniometer stage and evacuation system, are fully PC-controlled. This system stably produces high-quality data.
Imaging system
A new imaging system, consisting of four-stage intermediate lenses and two-stage projector lenses, achieves rotation-free energy-filtered TEM images and diffraction patterns over a wide range of magnifications and camera length.
Piezo-controlled goniometer
A new goniometer stage that incorporates a piezo device offers smooth operation for searching fields of view at the atomic level.
Integration to other instruments
The microscope can be fully controlled with PC. The design concept enables us to integrate EDS system and CCD cameras.
Application
Exploring Biological Samples in 3D Beyond Classic Electron Tomography
Atomic-Resolution Elemental Mapping by EELS and XEDS in Aberration Corrected STEM