- Laboratory
- Sample management
- Automatic sample preparation system
- Leica Microsystems
Automatic sample preparation system EM RES102laboratoryTEMbenchtop
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Characteristics
- Operation
- automatic
- Applications
- laboratory, TEM
- Configuration
- benchtop
Description
Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.
A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.