- Laboratory
- Sample management
- Automatic sample preparation system
- Leica Microsystems
- Company
- Products
- Catalogs
- News & Trends
- Exhibitions
Automatic sample preparation system EM RES102laboratoryTEMbenchtop
Add to favorites
Compare this product
Characteristics
- Operation
- automatic
- Applications
- laboratory, TEM
- Configuration
- benchtop
Description
Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the Leica EM RES102. The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit.
A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the Leica EM RES102 can also be used for very gentle sample processing using low ion energy.
Related Searches
- Leica sample preparation system
- Leica automatic sample preparation system
- Leica laboratory sample preparation system
- Leica benchtop sample preparation system
- Pharmaceutical sample processor
- Research sample preparation system
- Cooling sample processor
- High-speed sample processor
- Electron microscopy sample preparation system
- Strip sample processor
- Freezing sample preparation system
- Automatic ultramicrotome
- Ultramicrotome
- Rotary ultramicrotome
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.