Metallurgical microscope MJ33 in bright field & dark field is a microscope used in industrial inspection, equipped with bright/dark field objectives, wide field eyepiece and polarizing observation device. The reflective and transmitted illumination system adopts Kohler illumination with clear field of view. It can be used for the observation of semiconductor silicon wafer, LCD substrates, circuit boards, and other kinds of powder solid transparent or opaque industrial test specimen. This metallurgical microscope is an ideal instrument for research of biology, metallurgy, mineralogy, precision engineering and electronics engineering, etc.
Infinite optical system & lenses
Adopts infinity optical system and modularity function design.
Long working distance bright/dark field plan objectives, wide and clear field of view.
Wide field plan eyepiece: field number is 22mm.
Expand to DIC
Infinite optical system allows it expand to DIC function providing differential interference contrast imaging.
Polarizing function
Built in switchable polarizer device, analyzer 360°rotatable offers more observation method for metal specimen.
Epi- illumination system - 12V 50W halogen lamp, brightness adjustable
Built-in field diaphragm, aperture diaphragm and filter switching device.
Push-pull type analyzer and polarizer
Yellow, blue, green filter and frosted glass
Focus system - Coaxial coarse/fine focus system, with tension adjustable and limit stopper, minimum division of fine focusing: 2μm.
Nosepiece - Quintuple (Fixed nosepiece with backward inclined)
Stage - Double layer mechanical movable stage (size: 210mmX140mm, moving range: 75mmX50mm)