UV-vis spectrometer FX
Vis-NIRbenchtophigh-sensitivity

UV-vis spectrometer - FX - Ocean Insight - Vis-NIR / benchtop / high-sensitivity
UV-vis spectrometer - FX - Ocean Insight - Vis-NIR / benchtop / high-sensitivity
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Characteristics

Type
UV-vis, Vis-NIR
Configuration
benchtop
Other characteristics
high-sensitivity
Wavelength

Max.: 1,025 nm

Min.: 200 nm

Length

88.9 mm
(3.5 in)

Width

63.5 mm
(2.5 in)

Height

52.4 mm
(2.1 in)

Weight

400 g
(14.1 oz)

Description

Ocean FX offers rapid data acquisition, onboard processing, and versatile communication for high-speed applications like QC sorting and event measurement. Integration time - 0.01 ms – 10 s SNR (single scan @ 10 ms) - 290:1 Onboard memory - 50,000 spectra Connectors - 40 pin JAE DD4, Gigabit Ethernet, SMA 905 (input fiber), USB Temperature (operation) - 0 °C – 40 °C Temperature (storage) - -30 °C – 70 °C

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.