AZtecWave combines the high spectral resolution of the Wave Spectrometer, to resolve X-ray peaks and quantify minor and trace elements, with the speed and flexibility of EDS. This delivers an advanced and complete solution for compositional analysis on the SEM.
EDS and WDS are fully integrated and combined in the AZtecWave software, facilitating major element acquisition with fast and accurate EDS (powered by Tru-Q®) and enabling WDS to be effectively utilized when EDS reaches its limitations:
For the detection and accurate quantification of trace elements (10x improvement in spectral resolution)
Combine measurement of major-minor elements using EDS with the measurement of trace elements and/or heavily overlapped elements using WDS
Accurate
Determine the accurate composition of all elements (Be – Pu) at all concentration levels (major - trace)
The optimum X-ray lines are always available for analysis (Wave max. energy range = 0.07 – 15.33 keV)
Reliably detect and quantify trace elements, achieved with WDS detection limits of <100 ppm for many elements (e.g. Si Kα = 9 ppm, Fe Kα = 15 ppm)
Be certain of element identification, particularly where elements overlap in the EDS spectrum (e.g. transition metal K lines)
Accessible
Unique technology automatically optimizes WDS (+EDS) setup and analysis, guaranteeing excellent results for all levels of user
Review and assess the expected quality of WDS results (e.g. WDS scans) before pressing start, saving time
Step-by-step instructions, embedded help videos, and inbuilt spectrometer performance checks are included to make AZtecWave intuitive and easy to use
Quantitative X-Ray Analysis