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Transmission electron microscope software AZtecTEM
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Transmission electron microscope software - AZtecTEM - Oxford Instruments - visualization / reporting / acquisition
Transmission electron microscope software - AZtecTEM - Oxford Instruments - visualization / reporting / acquisition
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Transmission electron microscope software - AZtecTEM - Oxford Instruments - visualization / reporting / acquisition - image - 3
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Transmission electron microscope software - AZtecTEM - Oxford Instruments - visualization / reporting / acquisition - image - 6
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Characteristics

Applications
for transmission electron microscopes
Function
visualization, reporting, acquisition

Description

AZtecTEM is an innovative EDS software specifically optimised for advanced TEM applications. AZtecTEM is a unique system approach to the characterisation of materials at the nanoscale. Building on over 30 years Oxford Instruments’ experience in TEM technologies, AZtec is everything you should expect of a next-generation EDS system for TEM. Powerful Unleashes the potential of the latest generation of large area Ultim Max TEM SDDs - delivering sensitivity when count rates are low and a high capacity when count rates are high. Choice of detectors, including 100 mm2 active area with a special design that maximises solid angle Multiple detector systems enables over 2 sr solid angle (TEM and configuration dependent) Windowless options for outstanding low energy performance AZtec has a 64-bit performance and a true multi-tasking capability so you work at the maximum detector speed, visualise final results in real-time, report in parallel and get the job done faster than ever Flexible AZtecTEM provides the tools to explore data in your own way with a variety of options for data collection, processing and export Accurate Incorporates Tru-Q® technology to provide high accuracy AutoID and quantitative analysis - so you get the right results in real-time, time after time AutoLock™ provides a unique blend of predictive and reactive drift correction routines - vital when working at the nano and atomic scales TruMap® and TruLine™ correct for overlaps and other artefacts in real-time, then automatically visualise the data in the best way possible

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