Optical microscopy Spotlight 400

FT-IRlaboratoryspectral

Spotlight™ IR microscope systems are designed to meet the challenges of an expanding laboratory by generating high-quality, reproducible data from a variety of sample types. The Spotlight 400 FT-IR Imaging System combines high sensitivity and rapid imaging with ease-of-use. The ability to image large sample areas rapidly at high spatial resolution extends FT-IR microscopy into new applications. Overview The Spotlight 400 FT-IR Imaging System is designed with state-of-the-art technology to allow for intelligent automation and sophisticated analysis capabilities. The system incorporates a number of unique productivity tools and features an ATR imaging system that enables the collection of high resolution infrared images of extremely small samples to visualize the composition of materials based on FT-IR spectral data. Unique features of the Spotlight 400 System include: High quality spectral production and images from sample areas, yielding pixel resolutions of 6.25, 25, or 50 microns Region of Interest (ROI) finding to allow for ease of analysis of multiple particles and layers all at once Configurability to be used with extended range mid-IR, near-IR or dual range FT-IR with the Spectrum 3™ system to give maximum information from samples in the shortest possible time. Configurability to be used with mid-IR, near-IR, or dual range FT-IR with the Spectrum 3™ systems to give maximum information from samples in the shortest possible time.