Integrates user privileges, measurements, analyses, data visualization and reporting
SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components.
Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
Announcing: Total scattering measurements and PDF analysis
The reverse Monte-Carlo (RMC) option has been added to the SmartLab Studio II PDF plug-in. Accordingly, detailed information about total scattering measurements and PDF analysis is now available on a web page. For details, please refer to the following link: Total Scattering Measurements and PDF Analysis
Features
Seamless operations from measurement to reporting by single software platform
Clustering analysis and Data Visualization supports various data treatments
Network dongle provides software licenses maximum 10 PCs
Covers basic XRPD applications, e.g. qualitative, quantitative, crystallite size, Rietveld analysis, as well as advanced analysis, e.g. X-ray reflectivity, HRXRD, pole figure and PDF
Supports FDA 21 CFR Part 11 data integrity