X-ray diffractometer XtaLAB Synergy-ED

laboratory

Fully Integrated Electron Diffractometer A system any X-ray crystallographer will find intuitive to operate XtaLAB Synergy-ED is a new and fully integrated electron diffractometer, creating a seamless workflow from data collection to structure determination of three-dimensional molecular structures. The key feature of this product is that it provides researchers an integrated platform enabling easy access to electron crystallography. The XtaLAB Synergy-ED is a system any X-ray crystallographer will find intuitive to operate without having to become an expert in electron microscopy. The XtaLAB Synergy-ED is the result of an innovative collaboration to synergistically combine our core technologies: Rigaku’s high-speed, high-sensitivity photon-counting detector (HyPix-ED) and state-of-the-art instrument control and single crystal analysis software platform (CrysAlisPro for ED), and JEOL’s long-term expertise and market leadership in designing and producing transmission electron microscopes. The XtaLAB Synergy-ED was designed to address the increasing need to investigate smaller and smaller samples in structural research. With X-ray crystallography, the smallest possible crystal dimension is 1 micron, and only then when utilizing the brightest X-ray sources and noise free detectors. However, in recent years, there has been an increasing need for the structure analysis of substances that only form microcrystals, crystals that are only a few hundred nanometers or less in size. In recent years, a new analytical method, MicroED, has been developed that uses electron diffraction on a TEM electron microscope to measure 3D molecular structures from nanocrystalline materials.