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Optical spectrometer NEX CG II
EDXRFmulti-element

Optical spectrometer - NEX CG II - Rigaku Corporation - EDXRF / multi-element
Optical spectrometer - NEX CG II - Rigaku Corporation - EDXRF / multi-element
Optical spectrometer - NEX CG II - Rigaku Corporation - EDXRF / multi-element - image - 2
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Characteristics

Type
optical, EDXRF
Detector type
multi-element
Width

46.3 cm
(18.2 in)

Height

38.2 cm
(15 in)

Weight

65 kg
(143.3 lb)

Description

Next-Generation Cartesian Geometry Energy Dispersive X‑ray Fluorescence Spectrometers Enhanced elemental analysis for industrial quality control to advanced research applications NEX CG II Series are powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometers that deliver rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types—from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. The Rigaku NEX CG II Series are multi-element, multi-purpose analyzers, ideal for measuring ultra-low and trace element concentrations into the percent levels. These analyzers serve many industries and are especially well-suited for semi-quantitative determination of elemental content in complete unknowns. Applications range from industrial and in-plant quality assurance to research and development. They are easy to use for non-technical operators yet powerful enough for expert use in commercial labs and R&D facilities. Users can achieve the lowest limits of detection and easily manage complex applications. NEX CG II Series are ideal for testing agricultural soils and plant materials, analyzing finished animal feeds, measuring waste oils, environmental monitoring, pharmaceuticals, cosmetics, and many others. Available models are NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more demanding applications requiring a higher-powered system. Cartesian geometry and polarization for trace-level sensitivity NEX CG II Series build on NEX CG’s legacy of using Cartesian Geometry and secondary targets for trace-level sensitivity.

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