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EDXRF spectrometer NEX DE
X-ray fluorescenceinspectionbenchtop

EDXRF spectrometer
EDXRF spectrometer
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Characteristics

Type
EDXRF, X-ray fluorescence
Applications
inspection
Configuration
benchtop
Other characteristics
high-resolution
Width

356 mm
(14 in)

Height

260 mm
(10.2 in)

Weight

27 kg
(59.5 lb)

Description

High-Resolution Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer Elemental analysis of solids, liquids, powders, alloys and thin films As a premium high-performance benchtop energy dispersive X-ray fluorescence (EDXRF) elemental spectrometer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and thin films XRF elemental analysis in the field, plant or lab Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF. XRF with 60 kV X-ray tube and SDD detector The 60 kV X-ray tube and Peltier cooled silicon drift detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), along with high emission current and multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

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