Optical profiler S neox Five Axis
inspection3Dconfocal

optical profiler
optical profiler
optical profiler
optical profiler
optical profiler
optical profiler
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Characteristics

Type
optical
Applications
inspection
Observation technique
3D, confocal
Configuration
benchtop
Magnification

5 unit, 20 unit, 50 unit, 100 unit, 150 unit

Resolution

460 nm, 530 nm, 575 nm, 630 nm

Length

635 mm
(25 in)

Width

539 mm
(21.2 in)

Height

794 mm
(31.3 in)

Description

The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D optical profiler. This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric measurement. MEASURING TECHNOLOGIES Cover a wide range of scales S neox 3D measurement technologies cover a wide range of scales, including form (Ai Focus Variation), sub nanometric roughness (Interferometry) or critical dimensions that require high lateral resolution as well as vertical resolution (Confocal). MEASURING TECHNOLOGIES Maximum versatility The Five Axis system makes it possible to take automatic 3D surface measurements at defined positions, and combine them to create a complete 3D volumetric measurement or to inspect the surface finish at specific positions around the sample. MEASURING TECHNOLOGIES A complete 3D measurement S neox Five Axis is able to measure the sample at different positions of rotation and elevation (perspectives) generating a group of individual measurements. The SensoFIVE software merges all of the surfaces providing a sample surface with high accuracy by using the stacked image information of each single surface measurement. Merging different elevations, the system can provide shape and form information on sharp edges and/or critical surfaces. CONNECTING ADJOINING SURFACES Measure angles greater than 90º Measuring complex surfaces which contain steep angles is very difficult due to shadowing effects that prevent you from obtaining a complete measurement within a single acquisition.

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