Imaging film thickness monitor is a metrology tool that can visualize the film thickness distribution of a transparent multilayer film.
It can visualize the film thickness distribution with 0.1nm thickness resolution by using the spectroscopic reflectometry.
Visualize film thickness uniformity
Measure the film thickness/quality in the microscope field of view, Show the 3D distribution
Film thickness resolution : <0.1nm
Good thickness resolution equivalent to the spectrometry tools.
The wavelength can be selected from 450nm to 750nm with 1nm precision.
High speed / Multilayer measurement up to 9 layers
Parallel processing by the spectroscopic reflectometry
Advanced applications
① Several hundred repeated film such as the Bandpass Interference Filters and Composite multilayer film such as the Trench structure
② Sub micron pattern density estimation using Effective Medium Approximation (EMA)
③ Local area crystallinity evaluation such as Laser annealing
Measurement of film thickness distribution in the specified region of the Objective field of view.
Measure the 6.6x8.8mm□ area using the 1x obj.
Measure the 0.5um spatial resolution using the 50x obj.