Delivering 10 times the sensitivity of previous models, this innovative analyzer is capable of continuously measuring changes in particle size and particle size distribution at one-second intervals, within a range spanning 7 nm to 800 μm. In addition, unique options that accommodate the measurement of even high-concentration samples (up to 20 wt%) and trace quantity samples (down to 15 μL) are available. Due to its leading-edge measurement capabilities, the analyzer will likely be used for many applications in new areas, including nanotechnology, the life sciences, and fine bubbles (microscopic bubbles).
Features
Wide Measurement Range : 7 nm to 800 μm From primary particles to sub-visible particles and contaminants
Changes in particle size across the 7 nm to 800 μm measurement range can be continuously measured using a single light source, single optical system and single measurement principle.
Since a primary particle and an aggregate and contaminant can be measured with one system, the aggregation properties by a dispersion condition can be checked.
Single detection face continuously captures forward- scattered light up to a 60° angle
The target particle size range is seamlessly covered using a single measurement principle, single optical system, and single light source. Additionally, because the SALD-7500nano does not incorporate multiple optical systems that create discontinuities in the data, accurate particle size distribution measurements are possible across the entire measurement range using a single standard. The application of the SLIT* optical system, based on sophisticated scattered light intensity tracing technology,