The Phoenix V|tome|x L 300 is a versatile high-resolution walk-in cabinet microfocus system with nanoCT® option for 3D computed tomography (structure failure analysis & metrology) and 2D non-destructive X-ray inspection.
High-resolution CT Scanning of large and dense samples starts here
The Phoenix V|tome|x L 300 system is equipped with a unipolar 300 kV/500 W microfocus source and optional nano CT capability in Dual|tube combination with a 180kV/20W high-power nanofocus X-ray tube for best detail detactability of 2.0 µm.
The CT-scanner handles large samples up to 50 kg and up to 600 mm in diameter with extremely high precision. The system is a great flexible solution for void and flaw detection of composites, castings and precision parts, e.g. additive manufactured parts or turbine blades. It allows also high precision 3D metrology conform to VDI/VDE 2630-1.3.
Benefits
Unique Benefits:
Micro- and nanoCT Scanning at the limits of sample size and density (to 50 kg and up to 600 mm in diameter)
Great flexibility for 2D and 3D inspection on a wide application range
Features
Some of the Phoenix V|tome|x L 300 features are:
Fast CT acquisition and brilliant images by next generation highly sensitive Dynamic 41 detectors
Leading exclusive Waygate Technologies core components such as X-ray tubes, detectors, software
Patented optional features such as High-flux|target or Scatter|correct technology
- Leading measurement accuracy of SD ≤ (6.8 ± L/100 mm) µm referring to VDI/VDE 2630-1.3 for i.e. reliable revalidation of system performance
Applications
Highest precision micro- and nanoCT, e.g. for
Medium sized light alloys samples: Aluminum, Magnesium, Zinc