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SAXS diffractometer Nano-inXider
WAXSGISAXSfor research

SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research - image - 2
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research - image - 3
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research - image - 4
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research - image - 5
SAXS diffractometer - Nano-inXider - Xenocs - WAXS / GISAXS / for research - image - 6
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Characteristics

Type
SAXS, GISAXS, WAXS
Applications
for research

Description

Smart nanoscale characterization Directly from samples to results Accurate and high dynamic range measurements Simultaneous data from atomic- to nano-scale Low cost of ownership Accelerate your research The Nano-inXider gives you answers on the nanostructure of your sample, whether in solid, liquid, gel, powder or thin film. Examples of applications are: Particle size distribution, from a few nanometers to more than 250 nm Mesophase analysis of self-assembled materials such as liquid crystals, block copolymers, nano-drug delivery systems Nanostructure of biomaterials such as surfactants, proteins in solutions, hydrogels Crystallization rates and lamellar structure of semi-crystalline polymers during stress or temperature studies Orientation analysis on fibers and films With the Nano-inXider SMART design, just put your sample in the chamber. Then get your results. It is simple and fast. Sample Simple. Just put your sample in the chamber. The instrument auto-aligns without any need of user interaction. Measurement Data acquisition workflow is automatic and fast. X-ray scattering data is automatically normalized with no need of calibration by the user. This is achieved through a powerful software suite embedded in a fully motorized equipment using a unique fixed dual detector configuration. Analysis Accurate scattering data instantly displayed by the instrument can be used on the fly for quick sample feedback, or for further assisted analysis using our XSACT software. A large choice of analysis functions is available and quick nanostructure parameters are provided through few clicks.

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