Spectrometer measurement device DSR300

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DSR300 series micro-nano spectral response measurement system is dedicated to low-dimensional materials, providing high-precision spectral scanning and photo current scanning measurement. 40 m detection spot make the system can measure the minimum size 100 μm sample. Ultra-high stability light source provide the high accuracy; Multiple light sources can be integrated in the system to measure a variety of detectors. The friendly software is easy to use and automatically control the device to operate. Function： ■ Spectral Responsivity ■ External Quantum Efficiency ■ Bias Voltage IT Curve ■ LBIC Mapping ■ Response Linearity Test Main Technical Parameter Light Source Xenon light Source Spectral Range: 250 - 1800 nm Instability: ＜ 1% Supercontinuum light source Spectral Range: 400 - 2400 nm Frequency: 0.01 - 200 MHz Pulse width: 100 ps CW laser Optional Wavelength: 405 nm, 532 nm, 633 nm, 808 nm, 980 nm; Instability: ＜ 1% Pulsed laser Optional Wavelength: 375 nm, 405 nm, 488 nm, 785 nm, 976 nm; Pulse width: 100 ps Frequency: 1-20 MHz Micro lens 10x objective lens (Standard ) Work distance＞17 mm NA: 0.42 Spectral Range: 350 - 800 nm 50x objective lens Work distance＞17 mm NA: 0.42 Spectral Range: 480 - 1800 nm 50x UV objective lens Work distance＞12 mm NA: 0.42 Spectral Range: 240 - 500 nm 40x reflective objective lens Work distance＞7.8 mm NA: 0.5 Spectral Range: 200 nm - 20 um Data Acquisition Unit Lock-in Amplifier Frequency: 20 Hz - 1 KHz Drift: ＜ 0.1°/℃ below 10 kHz Voltage or Current Input mode 1nV to 1V full-scale sensitivity Current gain 106 or 108 V/A Dynamic Reserve >100 dB Display: X、Y、R、θ