Control measurement device DSR900
for sensorsautomaticbenchtop

control measurement device
control measurement device
control measurement device
control measurement device
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Characteristics

Tested parameter
control
Applications
for sensors
Operating mode
automatic
Configuration
benchtop

Description

DSR900 Camera Characteristics Measurement System is an advanced multi-functional test tool for evaluation of CCD and CMOS cameras and imaging sensors. Details DSR900 Camera Characteristics Measurement System is an advanced multi-functional test tool for evaluation of CCD and CMOS cameras and imaging sensors. The system complies with the European Machine Vision Association(EMVA) 1288, as well as the GB/T 17444-2013, so this system meet all measurement requirements for visible and infrared cameras. The user friendly software control the system to complete various tests with one click and get results quickly, reducing evaluation time from hours or days to minutes. As a result, the system is a ideal solution for manufacturers to evaluate and analyze high-end imaging cameras. Main Features ■ Full camera function test ■ Comply with the European Machine Vision Association(EMVA)1288, as well as the GB/T 17444-2013 ■ Meet all measurement requirements for visible and infrared cameras ■ Automatic control, “One-click” to complete test and output standardized test reports ■ High efficiency and fast test speed System Composition ■ Uniformly tunable light source: 150W high stability Xenon light source, low stray monochromator and 200 mm diameter integrated sphere ■ Uniform broadband light source: uniform, continuously adjustable intensity, large ■ Dark Chamber: Light tight, large space, 3D motorized stage ■ Intelligent Software: Full camera parameter test, automatic output test report Components Specifications Uniform Tunable Light Source Arc xenon lamp: 150 W, spectral range: 200 - 2500 nm, instability is less than 0.5%, 7.5 A working current, 3000h lifetime

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Exhibitions

Meet this supplier at the following exhibition(s):

Analytica China 2024
Analytica China 2024

18-20 Nov 2024 Shanghai (China)

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