Hitachi benchtop microscopes

Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm

The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

The SU8600 is the successor to the proven Regulus field emission SEM family and fulfills the highest requirements for imaging-oriented applications. The cold field emitter with its near monochromatic emission, combined with a magnetic ...

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

The SU3800/3900 VP-SEM family focusses on productivity. These tools automate repetitive tasks, so you can achieve reproducible results in a short time with little manual effort. Two different sample chambers with either tungsten or ...

Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm

FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...

Magnification: 10 unit - 250,000 unit
Length: 617 mm

Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, depth of field, ...

Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm

The Hitachi SU3800SE and SU3900SE SEMs provide versatile imaging and analytical solutions for various applications. These instruments offer high-resolution imaging, intuitive navigation, and advanced automation, delivering reliable, consistent ...

Magnification: 0 unit
Resolution: 4, 60 nm

... “ETHOS” FIB-SEM platform targets advanced position-accurate applications in the areas of automated production of ultra-fine TEM lamellae for aberration-corrected TEM/STEM, high-resolution multi signal SEM examination ...

Resolution: 1.6, 2.1, 4 nm

In this unique system, the Ga-FIB and FE-SEM columns are at right angles to each other. This configuration is ideal for applications where large volumes (biological tissue, materials with large grain structures, semiconductor components, ...

Resolution: 2.8, 60, 4, 3.5 nm

NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface ...